About this scholarly article

2007 IEEE International Electron Devices Meeting - Ultra-Low Leakage Silicon-on-Insulator Technology for 65 nm Node and Beyond by Cai, Jin; Majumdar, Amlan; Dobuzinsky, David; Ning, Tak H.; Koester, Steven J.; Haensch, Wilfried E. is a scholarly article available to read on EtoBox.

Author

Cai, Jin; Majumdar, Amlan; Dobuzinsky, David; Ning, Tak H.; Koester, Steven J.; Haensch, Wilfried E.

Publisher

IEEE

Published

2007