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What is Flicker Noise Variability in NMOS Transistors about?

This document discusses statistical characterization of flicker noise variability in nano-scale NMOS transistors due to intra-die process variations. It presents a theoretical model to estimate the variability in flicker noise power spectral density caused by variations in channel length, oxide thickness, and mobility. Monte Carlo simulations using BSIM-SPICE parameters were also performed on a 45nm CMOS process to validate the theoretical model. The model provides insight into how flicker noise variability

Author

Sarmista Sengupta

Language

EN