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About this scholarly article
Proceedings Electronic Components and Technology, 2005. ECTC '05. - Effect of Reflow Profiles on the Board Level Drop Reliability of Pb-Free (SnAgCu) BGA Assemblies by Lal, A.; Bradley, E.; Sharda, J. is a scholarly article available to read on EtoBox.
- Author
- Lal, A.; Bradley, E.; Sharda, J.
- Publisher
- IEEE
- Published
- 2005
- Language
- EN