About this scholarly article

2018 Metrology for Archaeology and Cultural Heritage (MetroArchaeo) - Effect of Applied Pressure on Patch Resonator-Based Measurements of Moisture Level for Cultural Heritage Materials by D'Alvia, Livio; Pittella, Erika; Pisa, Stefano; Piuzzi, Emanuele; Prete, Zaccaria Del is a scholarly article available to read on EtoBox.

Author

D'Alvia, Livio; Pittella, Erika; Pisa, Stefano; Piuzzi, Emanuele; Prete, Zaccaria Del

Publisher

IEEE

Published

2018