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About this Engineering article
Process Parameters Influence on Specific Contact Resistance (SCR) Value for TiAl Ohmic Contacts on GaN Grown on Sapphire by Menard, Olivier; Cayrel, Frédéric; Collard, Emmanuel; Alquier, Daniel is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Menard, Olivier; Cayrel, Frédéric; Collard, Emmanuel; Alquier, Daniel
- Publisher
- Trans Tech Publications, Ltd.; Trans Tech Publications Ltd. (ISSN 1662-9752)
- Published
- 2009
- Field
- Engineering (Physical Sciences)
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