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About this Engineering article
Enhanced Performance and Reliability of Organic Thin Film Transistors Through Structural Scaling in Gravure Printing Process by Kim, Jaemin; Chae, Daehwan; Lee, Wi Hyoung; Park, Janghoon; Shin, Jaehak; Kown, Byeong-Chan; Ko, Sunglim is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Kim, Jaemin; Chae, Daehwan; Lee, Wi Hyoung; Park, Janghoon; Shin, Jaehak; Kown, Byeong-Chan; Ko, Sunglim
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 1566-1199)
- Published
- 2018
- Language
- EN
- Field
- Engineering (Physical Sciences)