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About this Engineering article
Ellipsometric Simulation and Preliminary Observation of Fast Crystallization Behavior of Ge2Sb2Te5Amorphous Thin Films at Elevated Temperature by Kim, Dohyung; Kim, Sang Jun; An, Sung-Hyuck; Kim, Sang Youl is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Kim, Dohyung; Kim, Sang Jun; An, Sung-Hyuck; Kim, Sang Youl
- Publisher
- Institute of Pure and Applied Physics; Japan Society of Applied Physics; IOP Publishing (ISSN 0021-4922)
- Published
- 2003
- Field
- Engineering (Physical Sciences)
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