About this scholarly article

2008 International Conference on Prognostics and Health Management - Latent damage assessment and prognostication of residual life in airborne lead-free electronics under thermo-mechanical loads by Lall, Pradeep; Bhat, Chandan; Hande, Madhura; More, Vikrant; Vaidya, Rahul; Pandher, Ranjit; Suhling, Jeff; Goebel, Kai is a scholarly article available to read on EtoBox.

Author

Lall, Pradeep; Bhat, Chandan; Hande, Madhura; More, Vikrant; Vaidya, Rahul; Pandher, Ranjit; Suhling, Jeff; Goebel, Kai

Publisher

IEEE

Published

2008

Language

EN