About this scholarly article

2015 Portland International Conference on Management of Engineering and Technology (PICMET) - Modeling technological topic changes in patent claims by Chen, Hongshu; Zhang, Yi; Zhang, Guangquan; Zhu, Donghua; Lu, Jie is a scholarly article available to read on EtoBox.

Author

Chen, Hongshu; Zhang, Yi; Zhang, Guangquan; Zhu, Donghua; Lu, Jie

Publisher

IEEE

Published

2015