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About this Engineering article
Low-Frequency Diffusion Noise in Resistive-Switching Memories Based on Metal–Oxide Polymer Structure by Rocha, Paulo R. F.; Gomes, Henrique Leonel; Vandamme, Lode K. J.; Chen, Qian; Kiazadeh, Asal; de Leeuw, Dago M.; Meskers, Stefan C. J. is a Engineering article available to read on EtoBox.
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- Author
- Rocha, Paulo R. F.; Gomes, Henrique Leonel; Vandamme, Lode K. J.; Chen, Qian; Kiazadeh, Asal; de Leeuw, Dago M.; Meskers, Stefan C. J.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 2012
- Field
- Engineering (Physical Sciences)