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About this Chemistry article
Polarization-Dependent Atomic Force Microscopy–Infrared Spectroscopy (AFM-IR): Infrared Nanopolarimetric Analysis of Structure and Anisotropy of Thin Films and Surfaces by Hinrichs, Karsten; Shaykhutdinov, Timur is a Chemistry article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Chemistry.
- Author
- Hinrichs, Karsten; Shaykhutdinov, Timur
- Publisher
- Society for Applied Spectroscopy; SAGE Publications; SAGE Publications Inc. (ISSN 0003-7028)
- Published
- 2018
- Language
- EN
- Field
- Chemistry (Physical Sciences)