About this scholarly article

The use of SIMS in quality control and failure analysis of electrodeposited items inspected for hydrogen effects by E. Kossoy; Y. Khoptiar; C. Cytermann; G. Shemesh; H. Katz; H. Sheinkopf; I. Cohen; N. Eliaz is a scholarly article available to read on EtoBox.

Author

E. Kossoy; Y. Khoptiar; C. Cytermann; G. Shemesh; H. Katz; H. Sheinkopf; I. Cohen; N. Eliaz

Publisher

Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0010-938X)

Published

2008

Language

EN