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About this Engineering article
Crystallographic Orientation Analyses of Magnetite Thin Films Using Electron Backscatter Diffraction (EBSD) by Koblischka-Veneva, A.; Koblischka, M.R.; Mucklich, F.; Murphy, S.; Zhou, Y.; Shvets, I.V. is a Engineering article available to read on EtoBox.
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- Author
- Koblischka-Veneva, A.; Koblischka, M.R.; Mucklich, F.; Murphy, S.; Zhou, Y.; Shvets, I.V.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9464)
- Published
- 2006
- Field
- Engineering (Physical Sciences)