About this scholarly article

SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Efficient testing methodologies for microcameras in a gigapixel imaging system by Youn, Seo Ho; Lehmann, Peter H.; Osten, Wolfgang; Marks, Daniel L.; McLaughlin, Paul O.; Albertazzi, Armando; Brady, David J.; Kim, Jungsang is a scholarly article available to read on EtoBox.

Author

Youn, Seo Ho; Lehmann, Peter H.; Osten, Wolfgang; Marks, Daniel L.; McLaughlin, Paul O.; Albertazzi, Armando; Brady, David J.; Kim, Jungsang

Publisher

SPIE

Published

2013

Language

EN