About this scholarly article

SPIE Proceedings [SPIE SPIE Defense + Security - Baltimore, Maryland, United States (Sunday 17 April 2016)] Optical Pattern Recognition XXVII - Cross-correlation and image alignment for multi-band IR sensors by Casasent, David; Alam, Mohammad S.; Lu, Thomas; Chao, Tien-Hsin; Chen, Kang (Frank); Luong, Andrew; Dewees, Mallory; Yan, Xinyi; Chow, Edward; Torres, Gilbert is a scholarly article available to read on EtoBox.

Author

Casasent, David; Alam, Mohammad S.; Lu, Thomas; Chao, Tien-Hsin; Chen, Kang (Frank); Luong, Andrew; Dewees, Mallory; Yan, Xinyi; Chow, Edward; Torres, Gilbert

Publisher

SPIE

Published

2016