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What is Carbon Nitride Film Thickness Analysis about?
This study investigates a novel off-axis pulsed laser deposition (PLD) technique for growing carbon nitride films, revealing that increased nitrogen pressure leads to thicker films and a transition from elliptical to circular thickness distribution. X-ray photoelectron spectroscopy indicates that off-axis films have reduced nitrogen content compared to on-axis films, although their chemical structure remains similar. The findings suggest that the distance from the laser spot affects nitrogen and oxygen inco
- Author
- Wei Hu
- Language
- EN