About this scholarly article

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) - Comparison and correlation of ESD HBM (human body model) obtained between TLPG, wafer-level, and package-level tests by Lee, M.T.; Liu, C.H.; Chung-Chiang Lin, ; Jin-Tau Chou, ; Tang, H.T.H.; Chang, Y.J.; Fu, K.Y. is a scholarly article available to read on EtoBox.

Author

Lee, M.T.; Liu, C.H.; Chung-Chiang Lin, ; Jin-Tau Chou, ; Tang, H.T.H.; Chang, Y.J.; Fu, K.Y.

Publisher

ESD Assoc

Published

2000