About this scholarly article

36th International Electronics Manufacturing Technology Conference - Ultralow residue (ULR) semiconductor grade fluxes for copper pillar flip-chip by Lim, SzePei; Chou, Jason; Durham, Maria; Jo, Hyoryoon; Mackie, Andy is a scholarly article available to read on EtoBox.

Author

Lim, SzePei; Chou, Jason; Durham, Maria; Jo, Hyoryoon; Mackie, Andy

Publisher

IEEE

Published

2014

Language

EN