Skip to content

Opening book details…

About this Engineering article

Correlation Between Nitrogen Concentration Profile and Infrared Spectroscopy in Silicon Dioxide by Chang-Liao, Kuei-Shu; Lai, Han-Chao is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Chang-Liao, Kuei-Shu; Lai, Han-Chao
Publisher
American Institute of Physics; AIP Publishing (ISSN 0003-6951)
Published
1998
Field
Engineering (Physical Sciences)

More by Chang-Liao, Kuei-Shu; Lai, Han-Chao

Browse all works by Chang-Liao, Kuei-Shu; Lai, Han-Chao