About this scholarly article

SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Measuring for thickness distribution of recording layer of PLH by Zhang, Xiao-Chun; Guo, Lurong; Guo, Yongkang; Benton, Stephen A. is a scholarly article available to read on EtoBox.

Author

Zhang, Xiao-Chun; Guo, Lurong; Guo, Yongkang; Benton, Stephen A.

Publisher

SPIE

Published

1991

Language

EN