About this scholarly article

AIP Conference Proceedings [AIP INTERNATIONAL CONFERENCE ON PHYSICS OF EMERGING FUNCTIONAL MATERIALS (PEFM-2010) - Mumbai, (India) (22–24 September 2010)] - X-Ray And Polarized Neutron Reflectometry: Characterization Of Si∕Co∕Si And Si∕Ni∕Si Systems by Bhattacharya, Debarati; Basu, Saibal; Poswal, A. K.; Roy, S.; Dev, B. N.; Aswal, Dinesh K.; Debnath, Anil K. is a scholarly article available to read on EtoBox.

Author

Bhattacharya, Debarati; Basu, Saibal; Poswal, A. K.; Roy, S.; Dev, B. N.; Aswal, Dinesh K.; Debnath, Anil K.

Publisher

AIP

Published

2010