About this scholarly article

Proceedings of the 19th International Symposium on Power Semiconductor Devices and IC's - A Multiple Deep Trench Isolation Structure with Voltage Divider Biasing by Desoete, B.; De Smet, A.; Moens, P. is a scholarly article available to read on EtoBox.

Author

Desoete, B.; De Smet, A.; Moens, P.

Publisher

IEEE

Published

2007

Language

EN