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About this Engineering article
Research on the Mechanism of Flash Line Defect in Coining by Wen Zhong, Yuqi Liu, Yunming Hu... is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Wen Zhong, Yuqi Liu, Yunming Hu...
- Publisher
- Springer; Springer-Verlag; Springer Verlag; Springer Science and Business Media LLC; Society for Mining, Metallurgy and Exploration Inc. (ISSN 0268-3768)
- Published
- 2012
- Field
- Engineering (Physical Sciences)