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About this Engineering article
An On-Chip Detector of Transient Stress Events by Patnaik, Abhishek; Suchak, Mihir; Seva, Ramu; Pamidimukkala, Keerthana; Edgington, Greg; Moseley, Richard; Feddeler, James; Stockinger, Michael; Pommerenke, David; Beetner, Daryl G. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Patnaik, Abhishek; Suchak, Mihir; Seva, Ramu; Pamidimukkala, Keerthana; Edgington, Greg; Moseley, Richard; Feddeler, James; Stockinger, Michael; Pommerenke, David; Beetner, Daryl G.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9375)
- Published
- 2018
- Field
- Engineering (Physical Sciences)