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Test and Design-for-Testability in Mixed-Signal Integrated Circuits by Jose Luis Huertas Díaz is a nonfiction available to read on EtoBox.

What is Test and Design-for-Testability in Mixed-Signal Integrated Circuits about?

Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEE

Who reads Test and Design-for-Testability in Mixed-Signal Integrated Circuits?

Author

Jose Luis Huertas Díaz

Publisher

Springer US : Imprint: Springer

Published

2010

Language

EN

ISBN

9780387235219

Category

nonfiction

Subjects

Engineering, Stem