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About this Physics and Astronomy article
Relative lattice parameter measurement of submicron quaternary (InGaAsP) device structures grown on InP substrates by Twigg, M. E. ;Chu, S. N. G. ;Joy, D. C. ;Maher, D. M. ;Macrander, A. T. ;Chin, A. K. is a Physics and Astronomy article available to read on EtoBox.
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- Author
- Twigg, M. E. ;Chu, S. N. G. ;Joy, D. C. ;Maher, D. M. ;Macrander, A. T. ;Chin, A. K.
- Publisher
- American Institute of Physics; AIP Publishing; Publons (ISSN 0021-8979)
- Published
- 1987
- Language
- EN
- Field
- Physics and Astronomy (Physical Sciences)