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What is MOS Device Characterization Techniques about?
The document summarizes a two-part lecture on electrical characterization of MOS devices with advanced gate stacks given by Eric M. Vogel on June 11-12, 2005. It focuses on capacitance-voltage, conductance, tunneling, and charge-pumping measurements and discusses measurement issues, equivalent circuits, and parameter extraction techniques for characterizing MOS capacitors and gated diodes with thin, high-κ dielectrics.
- Author
- jvs57
- Language
- EN