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Proceedings 1996 IEEE Hong Kong Electron Devices Meeting - Failure of effective-channel length extraction methods due to the effect of the relative doping level of source and drain in short-channel LDD MOSFETs by Latif, Z.; Ortiz-Conde, A.; Liou, J.J.; Sanchez, F.J.G.; Wong, W. is a scholarly article available to read on EtoBox.
- Author
- Latif, Z.; Ortiz-Conde, A.; Liou, J.J.; Sanchez, F.J.G.; Wong, W.
- Publisher
- IEEE
- Published
- 1996
- Language
- EN
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