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About this Engineering article
Correction of the Escape Depth Effect in Sputter Depth Profiles by C. Palacio; J.M. Martínez-Duart is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- C. Palacio; J.M. Martínez-Duart
- Publisher
- Elsevier Science; Elsevier ; Elsevier Sequoia; Elsevier BV (ISSN 0040-6090)
- Published
- 1985
- Language
- EN
- Field
- Engineering (Physical Sciences)