About this scholarly article

2007 IEEE Nuclear Science Symposium Conference Record - Examination of the utility of commercial-off-the-shelf memory devices as X-ray detectors by Fullem, Travis Z.; Lehman, Lawrence P.; Cotts, Eric J. is a scholarly article available to read on EtoBox.

Author

Fullem, Travis Z.; Lehman, Lawrence P.; Cotts, Eric J.

Publisher

IEEE

Published

2007