About this scholarly article

2010 IEEE International Memory Workshop - Extraction of the retention properties of a phase-change cell from temperature-ramp tests using a novel method by Goux, L.; Hurkx, G.A.M.; Wang, X.P.; Delhougne, R.; Attenborough, K.; Gravesteijn, D.; Wouters, D.; Gonzalez, J. Perez is a scholarly article available to read on EtoBox.

Author

Goux, L.; Hurkx, G.A.M.; Wang, X.P.; Delhougne, R.; Attenborough, K.; Gravesteijn, D.; Wouters, D.; Gonzalez, J. Perez

Publisher

IEEE

Published

2010