About this scholarly article

20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05) - Methodologies and algorithms for testing switch-based NoC interconnects by Grecu, C.; Pande, P.; Baosheng Wang, ; Ivanov, A.; Saleh, R. is a scholarly article available to read on EtoBox.

Author

Grecu, C.; Pande, P.; Baosheng Wang, ; Ivanov, A.; Saleh, R.

Publisher

IEEE Comput. Soc

Published

2005

Language

EN