About this Engineering article
Electrical Conductivity Measurements with Submicrometer Lateral Resolution by P. Kazimierski; H. Lehmberg is a Engineering article available to read on EtoBox.
A scanning force microscope (SFM) working in the contact mode and equipped with a conducting tip was fully exploited for local electrical conductivity imaging. Thin layers of plasma-deposited Ge-C and ferrocene in a broad range of electrical specific conductivity were investigated in detail. The contrast observed in electrical current images was found to be correlated with powders incorporated into the film matrix. An attempt was made to detect the structure responsible for electrical transport. However. the samples appeared to be electrically homogeneous down to a scale of 50 nm.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- P. Kazimierski; H. Lehmberg
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0257-8972)
- Published
- 1998
- Language
- EN
- Field
- Engineering (Physical Sciences)