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Can I read Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits : 2nd Edition on EtoBox?
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits : 2nd Edition by Manoj Sachdev, José Pineda de Gyvez (auth.), Manoj Sachdev, José Pineda de Gyvez (eds.) is a nonfiction available to read on EtoBox.
What is Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits : 2nd Edition about?
Failures of nano-metric technologies owing to defects and shrinking process tolerances give rise to significant challenges for IC testing. As the variation of fundamental parameters such as channel length, threshold voltage, thin oxide thickness and interconnect dimensions goes well beyond acceptable limits, new test methodologies and a deeper insight into the physics of defect-fault mappings are needed. In __Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits__ state of the art of defect-oriented testing is presented from both a theoretical approach as well as from a practical point of view. Step-by-step handling of defect modeling, defect-oriented testing, yield modeling and its usage in common economics practices enables deeper understanding of concepts. The progression developed in this book is essential to understand new test methodologies, algorithms and industrial practices. Without the insight into the physics of nano-metric technologies, it would be hard to develop system-level test strategies that yield a high IC fault coverage. Obviously, the work on defect-oriented testing presented in the book is not final, and it is an evolving field with interesting challenges
Who reads Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits : 2nd Edition?
It is typically read by self-directed learners exploring a subject in depth.
Common subject areas: history, science, philosophy, social sciences.
- Author
- Manoj Sachdev, José Pineda de Gyvez (auth.), Manoj Sachdev, José Pineda de Gyvez (eds.)
- Publisher
- Springer US
- Published
- 2007
- Language
- EN
- ISBN
- 9780387465463
- Category
- nonfiction
- Subjects
- Engineering, Stem
Other editions & translations
More by Manoj Sachdev, José Pineda de Gyvez (auth.), Manoj Sachdev, José Pineda de Gyvez (eds.)
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