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LP2953 Total Dose Degradation Study by Charu Sharma is a document available to read on EtoBox.

This study evaluates the total dose degradation of low-dropout voltage regulators, specifically the LP2953, which uses a lateral pnp transistor as a pass transistor. The findings indicate significant variability in degradation levels between different production lots, with new devices failing at much lower radiation levels than previously reported. The research highlights the importance of lot-sample testing for ensuring reliability in space applications due to the sensitivity of these devices to radiation

Author

Charu Sharma

Language

EN