Skip to content

Opening book details…

Can I read Microstructural analysis of W irradiated at different temperatures on EtoBox?

Microstructural analysis of W irradiated at different temperatures by M. Klimenkov; M. Dürrschnabel; U. Jäntsch; P. Lied; M. Rieth; H.C. Schneider; D. Terentyev; W. Van Renterghem is a Materials Science article available to read on EtoBox.

What is Microstructural analysis of W irradiated at different temperatures about?

Pure W was neutron irradiated at 600 °C, 900 °C, 1000 °C, 1100 °C, and 1200 °C with a dose of ∼1 dpa, and its microstructure was subsequently analyzed using transmission electron microscopy (TEM). Three types of defects were observed and analyzed in detail: (i) voids, (ii) dislocation loops with a diameter of up to 20 nm and (iii) W-Re -Os containing precipitates. The TEM study includes a detailed examination of the defect structure, e.g., determination of the size and spatial distribution of voids, precipitates and dislocation loops. Application of g-imaging shows the formation of the interstitial loops with both 1⁄2 and 100 Burgers vectors. In addition, local chemical and structural analysis revealed the formation of χ-type precipitates, which are attached to the voids at 1100 °C. It was also found that voids, loops and precipitates are surrounded by a solid solution cloud enriched with Re and Os. The use of highly sensitive nanoscale chemical analysis allows the identification of differences in Re /Os segregation at and in the vicinity of the three defect types. A precise analysis of the chemical composition of the precipitates and clouds around the voids was achieved by a spec

Who reads Microstructural analysis of W irradiated at different temperatures?

It is typically read by researchers, students, and practitioners in Materials Science.

Author
M. Klimenkov; M. Dürrschnabel; U. Jäntsch; P. Lied; M. Rieth; H.C. Schneider; D. Terentyev; W. Van Renterghem
Publisher
Elsevier BV
Published
2022
Language
EN
Field
Materials Science (Physical Sciences)

More by M. Klimenkov; M. Dürrschnabel; U. Jäntsch; P. Lied; M. Rieth; H.C. Schneider; D. Terentyev; W. Van Renterghem

Browse all works by M. Klimenkov; M. Dürrschnabel; U. Jäntsch; P. Lied; M. Rieth; H.C. Schneider; D. Terentyev; W. Van Renterghem