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Can I read Atomic Force Microscopy for the Analysis of Environmental Particles on EtoBox?
Atomic Force Microscopy for the Analysis of Environmental Particles by Kathryn A Ramirez-Aguilar; David W Lehmpuhl; Amy E Michel; John W Birks; Kathy L Rowlen is a Physics and Astronomy article available to read on EtoBox.
What is Atomic Force Microscopy for the Analysis of Environmental Particles about?
In this study, atomic force microscopy (AFM) was evaluated as an alternative to electron microscopy for analysis of nano-to micron-sized environmental particles, such as atmospheric aerosols. The wide range of conditions under which AFM can be conducted allows for `reactivea imaging. For example, collected particles can be imaged under ambient conditions and re-imaged as a function of time in order to evaluate changes. Chemical information about individual particles can be obtained in two ways: (1) by monitoring relative reaction rates when the sample is exposed to a reactive gas, and (2) by determination of the magnitude of interaction forces between the AFM tip and individual particles. The combined advantages of digital, three-dimensional morphological information, no vacuum requirements, virtually no sample preparation, and real-time imaging during reaction, make AFM an excellent technique for analysis of environmental particles.
Who reads Atomic Force Microscopy for the Analysis of Environmental Particles?
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Kathryn A Ramirez-Aguilar; David W Lehmpuhl; Amy E Michel; John W Birks; Kathy L Rowlen
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0304-3991)
- Published
- 1999
- Language
- EN
- Field
- Physics and Astronomy (Physical Sciences)