About this scholarly article

2012 19th IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2012) - Statistical leakage analysis using the deterministic modeling of cell leakage current by Kim, Jae Hoon; Kim, Young Hwan is a scholarly article available to read on EtoBox.

Author

Kim, Jae Hoon; Kim, Young Hwan

Publisher

IEEE

Published

2012