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About this Physics and Astronomy article
Ellipsometric Determination of the Film Thickness and Conductivity during the Passivation Process on Nickel by Reddy, A. K. N.; Rao, M. G. B.; Bockris, J. O'M. is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Reddy, A. K. N.; Rao, M. G. B.; Bockris, J. O'M.
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0021-9606)
- Published
- 1965
- Language
- EN
- Field
- Physics and Astronomy (Physical Sciences)
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