About this scholarly article

2012 IEEE International Conference on Electron Devices and Solid State Circuit (EDSSC) - Multilevel set/reset switching characteristics in Al/CeOx/Pt RRAM devices by Liu, L.F.; Hou, Y.; Yu, D.; Chen, B.; Gao, B.; Tian, Y.; Han, D.D.; Wang, Y.; Kang, J.F.; Zhang, X. is a scholarly article available to read on EtoBox.

Author

Liu, L.F.; Hou, Y.; Yu, D.; Chen, B.; Gao, B.; Tian, Y.; Han, D.D.; Wang, Y.; Kang, J.F.; Zhang, X.

Publisher

IEEE

Published

2012