About this document
User-Defined Algorithm for Memory BIST by IJRES team is a document available to read on EtoBox.
Memory built-in self-test (BIST) is a widely used technique to allow the self-test and self-checking of the embedded memories on chips after the fabrication process. It can be used by implementing a standard testing algorithm available in the EDA tool library or a user-defined algorithm (UDA). This paper presents the development of software that automatically generates a description file of a UDA to be deployed for memory BIST circuit implementation using Tessent memory BIST software.
- Author
- IJRES team
- Language
- EN