About this scholarly article

2017 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC) - Laser-Induced Fault Injection on Smartphone Bypassing the Secure Boot by Vasselle, Aurelien; Thiebeauld, Hugues; Maouhoub, Quentin; Morisset, Adele; Ermeneux, Sebastien is a scholarly article available to read on EtoBox.

Author

Vasselle, Aurelien; Thiebeauld, Hugues; Maouhoub, Quentin; Morisset, Adele; Ermeneux, Sebastien

Publisher

IEEE

Published

2017