About this scholarly article

SPIE Proceedings [SPIE International Conference on Diffractometry and Scatterometry - Warszawa, Poland (Tuesday 24 May 1994)] Diffractometry and Scatterometry - Influence of surface roughness variations on the surface enhanced Raman scattering signal by Kruszewski, Stefan; Pluta, Maksymilian; Szyjer, Mariusz is a scholarly article available to read on EtoBox.

Author

Kruszewski, Stefan; Pluta, Maksymilian; Szyjer, Mariusz

Publisher

SPIE

Published

1994