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About this Materials Science article
Averaging the intensity of many-layered structures for accurate stacking-fault analysis using Rietveld refinement by Coelho, Alan A.; Evans, John S. O.; Lewis, James W. is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Coelho, Alan A.; Evans, John S. O.; Lewis, James W.
- Publisher
- International Union of Crystallography; Blackwell Publishing Inc.; International Union of Crystallography (IUCr) (ISSN 0021-8898)
- Published
- 2016
- Field
- Materials Science (Physical Sciences)