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About this Engineering article
High Resolution Structure Imaging and Image Simulation of Stacking Fault Tetrahedra in Ion-implanted Silicon by Coene, W.; Bender, H.; Amelinckx, S. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Coene, W.; Bender, H.; Amelinckx, S.
- Publisher
- Taylor and Francis Group; Informa UK (Taylor & Francis); Taylor & Francis; Informa UK Limited (ISSN 0141-8610)
- Published
- 1985
- Language
- EN
- Field
- Engineering (Physical Sciences)