Skip to content

Opening book details…

About this scholarly article

2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - CD-ECC: Content-dependent error correction codes for combating asymmetric nonvolatile memory operation errors by Wen, Wujie; Mao, Mengjie; Zhu, Xiaochun; Kang, Seung H.; Wang, Danghui; Chen, Yiran is a scholarly article available to read on EtoBox.

Author
Wen, Wujie; Mao, Mengjie; Zhu, Xiaochun; Kang, Seung H.; Wang, Danghui; Chen, Yiran
Publisher
IEEE
Published
2013
Language
EN

More by Wen, Wujie; Mao, Mengjie; Zhu, Xiaochun; Kang, Seung H.; Wang, Danghui; Chen, Yiran

Browse all works by Wen, Wujie; Mao, Mengjie; Zhu, Xiaochun; Kang, Seung H.; Wang, Danghui; Chen, Yiran