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About this Engineering article
Three-dimensional modeling of nanoscale Seebeck measurements by scanning thermoelectric microscopy by Z. Bian; A. Shakouri; L. Shi; H. Lyeo; C. K. Shih is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Z. Bian; A. Shakouri; L. Shi; H. Lyeo; C. K. Shih
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2005
- Language
- EN
- Field
- Engineering (Physical Sciences)
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