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2010 Annual Report Conference on Electrical Insulation and Dielectic Phenomena - Electric field analysis of high voltage apparatus using finite element method by Chao Zhang, ; Kester, J J; Daley, C W; Rigby, S J is a scholarly article available to read on EtoBox.

Author
Chao Zhang, ; Kester, J J; Daley, C W; Rigby, S J
Publisher
IEEE
Published
2010
Language
EN

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