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About this scholarly article
2010 Annual Report Conference on Electrical Insulation and Dielectic Phenomena - Electric field analysis of high voltage apparatus using finite element method by Chao Zhang, ; Kester, J J; Daley, C W; Rigby, S J is a scholarly article available to read on EtoBox.
- Author
- Chao Zhang, ; Kester, J J; Daley, C W; Rigby, S J
- Publisher
- IEEE
- Published
- 2010
- Language
- EN
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