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Wafer-scale Solution-derived Molecular Gate Dielectrics for Low-voltage Graphene Electronics by Sangwan, Vinod K.; Jariwala, Deep; Everaerts, Ken; McMorrow, Julian J.; He, Jianting; Grayson, Matthew; Lauhon, Lincoln J.; Marks, Tobin J.; Hersam, Mark C. is a Engineering article available to read on EtoBox.

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Author
Sangwan, Vinod K.; Jariwala, Deep; Everaerts, Ken; McMorrow, Julian J.; He, Jianting; Grayson, Matthew; Lauhon, Lincoln J.; Marks, Tobin J.; Hersam, Mark C.
Publisher
American Institute of Physics; AIP Publishing (ISSN 0003-6951)
Published
2014
Field
Engineering (Physical Sciences)

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