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About this Materials Science article
Functional degradation of NiZnCu-based multilayer chip inductors during nickel electroplating by Jiang Li Cao; Xiao Hui Wang; Li Zhang; Long Tu Li is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Jiang Li Cao; Xiao Hui Wang; Li Zhang; Long Tu Li
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0167-577X)
- Published
- 2002
- Language
- EN
- Field
- Materials Science (Physical Sciences)
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